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Elemental Analysis
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Optical Emission Spectrometers In-Line XRF Analyzers Handheld XRF Spectrometers X-Ray Coating Analysis TXRF Spectrometers Micro-XRF Spectrometers EPR Instruments Itrax Core Scanner Information Management Systems
Surface Analysis
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Stylus Profilometers 3D Optical Microscopes Nanomechanical Test Instruments Tribometers and Mechanical Testers Atomic Force Microscopes
Solar Energy Detection/Semiconductor
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Film Stress Film Adhesion
General Equipment
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DANTE DPP (digital pulse processor) Charge Sensitive Preamplifier CUBE PV/I-V Test Coating Thickness Gauges AFM Probes

Line Card

Brand：Frontier Semiconductor

Model：Line Card

Keyword tag：Film Stress；FEOL Electrical Characterization；Thin wafer metrology；Line Card

021-37018108Online Message

Line Card

3DIC TSV and BWS TTV
Film Stress
FEOL Electrical Characterization
Thin wafer metrology
Film AdhesionGlobal Film Stress Adhesion
Local and Lattice Stress
Thickness, Topography & Geometry
Contact and Non-Contact Sheet Resistance

Metrology Tools forSemiconductor, LED, Solar, FPD, MEMS, Data Storage

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Contact our application team immediately: 021-37018108, info@boyuesh.com

Online Message

Tel：86-021-37018108

Fax：86-021-57656381

Email：info@boyuesh.com

Address：Room 301, 28 Songjiang Hi-tech park, 518 Xinzhuan Road, Songjiang District, Shanghai

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